HSPM-07RT room temperature permanent magnet Hall test system consists of high-precision Hall tester, room temperature permanent magnet fixture platform, test computer and software, can be achieved in a fixed magnetic field Hall effect measurement, the system structure desktop structural design, small size, high testing efficiency, is a rapid laboratory testing and factory quality inspection of choice. The system has 77K liquid nitrogen single-point option, providing samples at 77K low temperature to complete the Hall effect measurement.

The system adopts scientific and reasonable common ground design, all the internal electrical signal lines adopt tri-coaxial cable, which guarantees the measurement of high-resistance semiconductor materials, and can accurately measure the carrier concentration mobility, resistivity, Hall coefficient and other important parameters of the sample. Room temperature permanent magnet fixture platform, you can easily move and flip the magnetic field, can simultaneously meet the fast Hall and DC Hall test, using PCB insertion and removal of the sample card design, taking into account the Vanderbilt and Holbar samples.

Features:
- Magnetic field better than 0.7T (room temperature measurement); magnetic field better than 0.5T (liquid nitrogen single point option)
- Permanent magnets move on a slide that can be easily flipped for both Fast Hall and DC Hall testing.
- Simple insertion and removal of sample cards for quick and easy sample handling for both Hall Bar and Vanderbilt samples.
- Sample cards include spring-loaded beryllium copper four-probe cards, bent tungsten four-probe cards, and soldered sample cards to meet a variety of sample testing needs.
- Scientific and reasonable design of common ground and tri-coaxial structure, to ensure the performance of the system of high resistance testing, resistance up to 100GΩ.
- The test chamber has a gas line valve, can be passed into the nitrogen, argon protection, but also can be extracted vacuum
- 77K low-temperature option can be added to test the Hall parameters under liquid nitrogen single-point temperature.

Test materials:
- Thermoelectric materials: bismuth telluride, lead telluride, silicon-germanium alloys, etc.
- Photovoltaic materials/solar cells: A silicon (monocrystalline silicon, amorphous silicon), CIGS (copper indium gallium selenide), cadmium telluride, chalcogenide, etc.
- Organic materials: OFET, OLED, etc.
- Transparent conductive metal oxide TCO: ITO, AZO, ZnO, IGZO (indium gallium zinc oxide), etc.
- Semiconductor materials: SiGe, InAs, SiC, InGaAs, GaN, SiC, InP, ZnO, Ga2O3, etc.
- Two-dimensional materials: graphene, BN, MoS2, etc.