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HSPM-05VT

HSPM-05VT

The HSPM-05VT Variable Temperature Hall Test System provides a continuous variable temperature, 0.5T vertical magnetic field test environment from 80K to 500K for testing Hall parameters at variable temperatures. Dual-layer sample holder design, the bottom of the optical sample holder, through the addition of four probes plus four terminal holder cover to achieve the probe sample holder function. The terminal block supports the addition of probes and can be converted to a six-probe sample holder, which can simultaneously meet the testing of Hall Bar and Vanderbilt samples.

HSPM-05VT Overview

HSPM-05VT Variable Temperature Hall Test System consists of a Hall tester, a liquid nitrogen storage thermostat and a permanent magnet movement mechanism, which can provide a continuous variable temperature and 0.5T vertical magnetic field test environment from 80K to 500K for samples, and it can test Hall parameters under variable temperature, which is a great convenience for scientific experiments that require both low and high temperatures. This is a very cost-effective, but also the use of more users Hall test system, can achieve a wide range of temperature testing, can also be equipped with other meters, as a pure temperature environment and magnetic environment for other tests.

Features:
- Dual layer sample holder design with an optical sample holder on the bottom and probe holder functionality by adding a four probe plus four lug sample holder cover. Terminal support
The addition of a six-probe holder allows for the simultaneous testing of Holba and Vanderbilt samples.
- Fitted with an adjustment bracket to adjust the vertical position of the thermostat.
- A magnet shifting device allows the permanent magnet to be moved back and forth and turned over.
- Sample chamber can be opened quickly to change samples.
- Liquid nitrogen can be easily filled through the liquid nitrogen refill port on the top of the thermostat, and the refill of liquid nitrogen will not affect the temperature control of the system.
- The thermostat is equipped with a liquid nitrogen flow adjustment lever, which can be used to adjust the thermostat's cooling capacity.
- Leakage current is less than 1pA@1V when used with cryogenic coaxial cable and triaxial/SMA connectors.
- Built-in heaters and sensors work in conjunction with an external thermostat to achieve variable temperature and temperature control of the cryostat.

Test materials:
- Thermoelectric materials: bismuth telluride, lead telluride, silicon germanium alloys, etc.
- Photovoltaic materials/solar cells: (A silicon (monocrystalline silicon, amorphous silicon))
CIGS (copper indium gallium selenide), cadmium telluride, chalcogenide, etc.)
- Organic Materials: (OFET, OLED)
- Transparent Conductive Metal Oxide TCO: (ITO, AZO, ZnO)
IGZO (Indium Gallium Zinc Oxide), etc.)
- Semiconductor materials: SiGe, InAs, SiC, InGaAs, GaN,
SiC, InP, ZnO, Ga2O3, etc.
- Two-dimensional materials: graphene, BN, MoS2, etc.


HSPM-05VT Technical Parameter


Parameters and indicators:

Standard resistance range
10mΩ-100GΩ
Mobility
10-2-106cm2/VS
Carrier concentration
8x102-8x1023/cm3
Voltage excitation range
100nV ~ 10V
Current excitation range
10pA ~ 100mA
Test method
Vanderbilt or Holba
Sample size
Φ50mm
Sample contact method
Four-probe sample holder, upgradable to six-probe or terminal post
Sample temperature
85-500K
Sample environment
Vacuum
Magnetic field
0.5T
Magnetic field regulation method
Manual displacement and flipping
Magnetic gap
30mm
Uniform magnetic field zone
10mm*10mm*10mm is superior to 5%


HSPM-05VT Basic Configuration

Semiconductor
IC
Wafer

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