Location：Home > Products > Hall Effect Test System > HSEM Series
Products:
- ALL
- Probe Stations
- Superconducting Magnet Systems
- Cryostat
- Hall Effect Test System
- Three-dimensional magnetic field test rig
- Temperature sensor
- Temperature Controllers & Monitors
- Low-temperature sample rod
- Delft Circuits
- Agilent Molecular Pumps
- Cryogenic Accessories
- Cryocoolers
- Junction box
- Permanent magnet
-
HSEM-06PS
HSEM-06PS Room Temperature Variable Field Probe Bench Hall Test System can be placed 4 inch wafer samples, using porous zoning control gas adsorption fixation, can provide a variable magnetic field environment, magnetic field size ± 0.6T , can be installed 6 probe arm. External connection to other electrical instrumentation can be at room temperature on the chip, wafer and device for non-destructive electrical testing, such as current, voltage, resistance and other electrical signals under different magnetic fields.
Click here for details -
HSEM-15
HSEM series electromagnet Hall effect test system consists of electromagnet, Hall tester, controller, sample variable temperature options and other components. There are continuously variable magnetic field environment, can choose ± 0.8T or ± 1.5T two configurations, there are more abundant temperature options, including: room temperature, liquid nitrogen single-point, 10K-400K closed-cycle low-temperature options, room temperature-1273K high-temperature options.
Click here for details
- Page 1 of 1
