With the continuous development of electronic technology, for precision micro (nano-scale) microelectronic devices, to test its electrical properties (such as current, voltage, impedance, etc.) in a low-temperature environment or a variable temperature environment, a cryogenic probe stage with a microscope can provide a good low-temperature electrical test environment.

Permanent magnet cryogenic probe stations play a vital role in scientific research and technology development. It is capable of performing various non-destructive physical and electrical property tests on samples at low temperatures, helping researchers to gain a deeper understanding of the physical and electrical properties of materials or devices, thus providing important data support for the development and application of new materials.

PSM-PM series permanent magnet low-temperature probe stage is a probe stage specially developed for the low-temperature vertical magnetic field electrical testing environment, providing 0.5T vertical magnetic field, capable of 2 inch, 4 inch, wafer for repeatable, standard electrical experiments, external different test equipment can be completed on the device of the electrical characteristics of the measurement, parameter measurement, DC measurement, RF measurement and Hall measurement.