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PSM-PM Series

PSM-PM Series

PSM-PM series permanent magnet low temperature probe stage is a probe stage developed specifically for low-temperature vertical magnetic field electrical test environment, providing 0.5T vertical magnetic field, able to 2 inch, 4 inch, wafer for repeatable, standard electrical experiments, external different test equipment can be completed on the device's electrical characteristics of the measurement, parametric measurements, DC measurements, RF measurements and Hall measurements. Permanent magnet low temperature probe stage PSM-PM series, specific parameters, please consult customer service!

PSM-PM Series Overview

With the continuous development of electronic technology, for precision micro (nano-scale) microelectronic devices, to test its electrical properties (such as current, voltage, impedance, etc.) in a low-temperature environment or a variable temperature environment, a cryogenic probe stage with a microscope can provide a good low-temperature electrical test environment.

Permanent magnet cryogenic probe stations play a vital role in scientific research and technology development. It is capable of performing various non-destructive physical and electrical property tests on samples at low temperatures, helping researchers to gain a deeper understanding of the physical and electrical properties of materials or devices, thus providing important data support for the development and application of new materials.

PSM-PM series permanent magnet low-temperature probe stage is a probe stage specially developed for the low-temperature vertical magnetic field electrical testing environment, providing 0.5T vertical magnetic field, capable of 2 inch, 4 inch, wafer for repeatable, standard electrical experiments, external different test equipment can be completed on the device of the electrical characteristics of the measurement, parameter measurement, DC measurement, RF measurement and Hall measurement.

PSM-PM Series Technical Parameter

Parameters and indicators:

Probe station host classification
ModelPSM-PM-2PSM-PM-2H
Temperature range
80K--500K
80K--800K
Temperature control stability
+/-50mK
+/-100mk
Sample holder
Type and Material

Oxygen-free copper grounding

 gold-plated sample holder

Oxygen-free copper grounding 

sample holder

size2 inches2 inches
Optional specifications
Insulated sample holder (temperature can only reach 400K)
Coaxial sample holder (temperature can only reach 400K)
Three-coaxial sample holder (temperature can only reach 400K)
Probe arm
typeDC probe arm
quantity4
Connectors and cables
Triple coaxial connector+ultra-thin coaxial low-temperature cable
leakage current100fA@1V in a vacuum environment
signal frequency
 DC--50MHz
Matching impedance 
50Ω
Displacement range
Z +/-6.5mm R+/-10°
X+/- 50mm,Y+/- 12.5mm 
Optical system
Microscope magnification
10-180 times
resolution
3μm
field of view
22mm
working distance
 90-100mm
Vacuum chamber
materialaluminum alloy
cavity volume
 4L
Overall dimensions
800*800*600
cavity inner diameter
 124mm
Window size
 0mm
Vacuum chamber window
Infrared absorption window
Radiation-proof screen window 
N/A            Standard quartz window
degree of vacuum
 5*10E-4 torr
reserved interface
2 probe arm interfaces & 2 electrical interfaces
Radiation-proof screen material
                    N/A                   stainless steel
Nitrogen cavity
liquid nitrogen capacity
 0.5L
Cooldown
60 minutes to 80K
nitrogen consumption
0.2L from room temperature to 80K
Liquid nitrogen holding time
 4 hours @ 80K
Sliding table
X-Y travel2/4 inches: X-Y axis ±50mm
reading accuracy10μm
Permanent magnet assembly
magnetic field strength0.5T
magnet spacing30mm
Magnet pole face size50mm
Dedicated vibration isolation table
size
 800*800*800
 900*900*800
table push
 Fixed foot & rolling wheel

PSM-PM Series Basic Configuration

Semiconductor
IC
Wafer

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