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HX12N Series
HX12N series semi-automatic probe table is equipped with high-precision linear motor sliding table module, the stroke to meet the 8-inch, 12-inch chip testing. High positioning accuracy, fast response speed and long service life and other advantages, the sliding table is also equipped with a high-precision grating feedback system to ensure the reliability of the operating accuracy, and the module for the company's own research products, to ensure the quality of the finished product and the production cycle of the module for the test of the probe table provides a fast and accurate hardware protection.
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HX80N Series
The HX80N series semi-automatic probe station is a customised comprehensive wafer probe station for sensor wafer testing with excellent test accuracy and can be paired with a customised instrumentation system to complete testing of sensors such as photoelectric sensors, pressure sensors and gas sensors.
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HX50N Series
HX50N series semi-automatic probe table is suitable for 4-inch, 5-inch wafers, including diodes, transistors, MOSFET tubes, vertical structure of the measurement of the chip, especially suitable for warped wafers and high-voltage chip testing, optional multi-needle test function, can be achieved at the same time more than one of the requirements of the measurement, to improve the test capacity of the machine.
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