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PSM-EM Series

PSM-EM Series

PSM-EM cryogenic probe station is a closed-cycle horizontal magnetic field electromagnet probe station, through the addition of +0.6T horizontal electromagnet to strengthen the performance of the standard probe station, for semiconductor chip electrical parameter testing to provide a 4.5K-350K high and low-temperature vacuum test environment, which can be done for all the standard I, CV, microwave and optoelectronic experiments and the level of the electromagnetic field measurements, the researcher can be Researchers can perform magnetic transport measurements with it, PSM-EM is a high quality probe station for vector magnetic transport measurements in cryogenic probe stations to achieve both large magnetic fields in samples and non-destructive electrical testing of chips, wafers and devices in cryogenic vacuum environments. For detailed parameters and specifications, please contact online customer service!

PSM-EM Series Overview

    Low temperature probe stations play a crucial role in scientific research and technological development. It can perform various non-destructive physical and electrical performance tests on samples at low temperatures, helping researchers gain a deeper understanding of the various physical and electrical properties of materials or devices, and providing important data support for the development and application of new materials.
    The PSM-EM low-temperature probe station is a closed-loop horizontal magnetic field electromagnetic probe station that enhances the performance of the standard probe station by adding a+0.6T horizontal electromagnetic field. It can provide a 4.5K-350K high and low temperature vacuum testing environment for electrical parameter testing of semiconductor chips. It can perform all standard I, CV, microwave and optoelectronic experiments and horizontal electromagnetic field measurements. Researchers can use it to perform magnetic transport measurements. PSM-EM is a high-quality probe station for vector magnetic transport measurements in low-temperature probe stations, which can achieve both large magnetic fields of samples and non-destructive electrical testing of chips, wafers and devices in low-temperature vacuum environments.


PSM-EM Series Technical Parameter

Parameter information:

PSM-EM Series Basic Configuration

Semiconductor
IC
Wafer

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