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PSM-LHe series
The PSM-LHe series liquid helium low-temperature probe station can provide a 1.6K-450K high and low temperature vacuum testing environment for electrical parameter testing of semiconductor chips. By connecting different electrical measuring instruments externally, it can complete the detection of parameters such as voltage, current, resistance, and IV curve of integrated circuits, and is used for non-destructive electrical testing of chips, wafers, and devices in low-temperature vacuum environments.
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PSM-LN2 Series
The PSM-LN2 series liquid nitrogen high and low temperature probe station provides a high and low temperature vacuum testing environment ranging from 80K to 800K for electrical parameter testing of semiconductor chips. By connecting different external electrical measurement instruments, it can complete parameter detection of integrated circuits such as voltage, current, resistance, and IV curve, and is used for non-destructive electrical testing of chips, wafers, and devices in a low-temperature vacuum environment.
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PSM-4K Series
PSM-4K series cryogenic probe station is a closed-cycle cryogenic probe station, compact and low vibration design, can provide a <5K-350K high and low temperature vacuum test environment for semiconductor chip electrical parameter testing.
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PSM-65K Series
PSM-65K Low Temperature Probe Stage, using a small low vibration closed-cycle refrigeration, without the need to consume liquid helium, the temperature of 65K, vibration is less than 1 μm, a wide range of test temperatures to support the 65K-350K continuous temperature change, low power consumption, input power of 320W.
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PSM-PM Series
PSM-PM series permanent magnet low temperature probe stage is a probe stage developed specifically for low-temperature vertical magnetic field electrical test environment, providing 0.5T vertical magnetic field, able to 2 inch, 4 inch, wafer for repeatable, standard electrical experiments, external different test equipment can be completed on the device's electrical characteristics of the measurement, parametric measurements, DC measurements, RF measurements and Hall measurements. Permanent magnet low temperature probe stage PSM-PM series, specific parameters, please consult customer service!
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PSM-SM Series
PSM-SM Cryogenic Probe Stage is a closed-cycle superconducting magnet probe stage with ±3T superconducting magnets that provides a 10K-500K high and low-temperature vacuum test environment for electrical parameter testing of semiconductor chips. It can perform all standard IV, CV, microwave and photovoltaic experiments, as well as superconducting perpendicular field measurements, and allows researchers to perform Hall measurements and magnetotransport measurements. The PSM-SM can be designed for 90° measurements on 2" diameter samples, which can be kept hot during cooling to reduce the tendency to condense, especially important for testing organic materials. Superconducting Magnet Cryogenic Probe Stations PSM-SM series, please contact online customer service for specific parameters!
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PSM-EM Series
PSM-EM cryogenic probe station is a closed-cycle horizontal magnetic field electromagnet probe station, through the addition of +0.6T horizontal electromagnet to strengthen the performance of the standard probe station, for semiconductor chip electrical parameter testing to provide a 4.5K-350K high and low-temperature vacuum test environment, which can be done for all the standard I, CV, microwave and optoelectronic experiments and the level of the electromagnetic field measurements, the researcher can be Researchers can perform magnetic transport measurements with it, PSM-EM is a high quality probe station for vector magnetic transport measurements in cryogenic probe stations to achieve both large magnetic fields in samples and non-destructive electrical testing of chips, wafers and devices in cryogenic vacuum environments. For detailed parameters and specifications, please contact online customer service!
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