The main purpose of the Compact Room Temperature Manual Probe Station is to provide a test platform for the electrical parameter testing of semiconductor chips, with different external measuring instruments, which can be used to complete the testing of integrated circuits such as voltage, current, resistance, and capacitance-voltage characteristic curves, etc., and is used for the non-destructive testing of ultra-small chip wafers and devices at room temperature.

  SPSM Series Compact Room Temperature Manual Probe Table is an affordable, entry-level probe table capable of performing a large number of non-destructive, standard electrical experiments on 2-inch and 4-inch wafers, and external different test equipment can be used to complete electrical characterisation, parametric and DC measurements on devices. The compact desktop design is the choice for academic and experimental research.

Features：
- Sample holders can hold 4" wafer samples.
- Under-mounted displacement holder allows for fine 3D displacement of the holder for easy sample testing and sample changeover.
- 6 probe arms can be mounted
- The probe arms are magnetised and can be moved arbitrarily, and can be fine-tuned in three dimensions for easy operation and accurate pinning, and the probes of the four arms can be pinned to any position of the sample.
- The probe arm adopts tri-coaxial cable and tri-coaxial connector, the leakage current is small, within 100fA.
- CCD magnification is 180 times, working distance is 100mm.

Model classification：