Cryogenic Probe Stations play a vital role in scientific research and technology development. It is capable of performing various non-destructive physical and electrical property tests on samples in a low-temperature environment, which helps researchers gain an in-depth understanding of the various physical and electrical properties of materials or devices, thus providing important data support for the development and application of new materials.

  PSM-65K Cryogenic Probe Station is an economical and compact closed-cycle cryogenic probe station with compact and low vibration design, which can provide a <65K-350K high and low-temperature vacuum test environment for electrical parameter testing of semiconductor chips, and by connecting with different electrical measurement instruments, it can complete the testing of materials/devices with parameters such as IV, CV, optics, and microwave, etc., and realise non-destructive electrical testing of chips, wafers and devices in a low-temperature vacuum environment. Non-destructive electrical testing of chips, wafers and devices under low-temperature vacuum environment.

Features:
- Uses small, low-vibration closed-cycle refrigeration without liquid helium consumption at 65K.
- Vibration is less than 1μm.
- Wide test temperature range, support 65K-350K continuous temperature change.
- Low power consumption, input power 320W.
- Probe arm displacement adjustment is operated outside the vacuum chamber, allowing different devices on the sample to be switched for testing without destroying the vacuum.
- The unique four-dimensional X-Y-Z-R adjustment of the probe arm allows for testing of up to 4-inch samples.
- The probe arm adopts tri-coaxial connector with good leakage performance, measured leakage current is less than 100fA @1V@65K-350K.
- The vacuum cavity is made of aluminium, which can effectively reduce the external electromagnetic interference and improve the accuracy and stability of the test.

Parameters and indicators: